Speaker
Radek Zenkl
Plant Pathology, ETH Zurich, Switzerland
Talks at this conference:
| Th, 14:30 | Towards high throughput in-field detection and quantification of wheat foliar diseases with deep learning |
Speaker
Plant Pathology, ETH Zurich, Switzerland
| Th, 14:30 | Towards high throughput in-field detection and quantification of wheat foliar diseases with deep learning |